In Today’s episode, Markus speaks with Alain Diebold, Ph.D. Dr. Diebold is the Empire Innovation Professor Emeritus of Nanoscale Science at SUNY Polytechnic Institute in Albany New YorkIn This Episode, they speak about:Was there a distinction between lab and fab in early incarnations of Metrology?Success Stories from Alain’s Relationship with SEMATECHHow to address the “Valley of Death” between a well-nurtured academic idea and an actual productWhat is an effective way to approach future metrology challenges?The Purpose and “why” behind the 2022 Frontiers of Characterization and Metrology for Nanoelectronics Conference. (FCMN)Alain’s main Takeaways from the most recent conference To make sure you never miss an episode of The High EQ Market podcast, subscribe on Apple Podcasts, Spotify, or anywhere you listen to your podcasts!Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.

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“What did the council decide on item 42?” — answered with the speaker and the moment.

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